More importantly, their use of rhyme, ala Dr. Seuss, makes for an easy read. Here's a short excerpt from the book's introduction which illustrates my point.

"An ion is so very small
You'll never see one in the hall
You'll never see one at the mall

You'll never see one at your house
You'll never see one with a mouse

These tiny things you'll never see
Are still very useful to you and me
They're also useful to industry."

1 of 1 found the following review helpful:


Not what I did expect  Jun 06, 2008 By Dr. Vratko Vokal "Vratko"
First, I must say that I am reviewing this book from a side of scientist who wanted to learn mostly on applications and on related physics necessary to understand a topic of application itself.

Minuses of the book:
-Book is not thorough on application. One-day review of journal publications would do better. I did expect much more, much much more on application, especially when much more is present at the field.
-Pictures are of the lowest quality I have ever seen in 2k book. It is something one would expect from the book printed in 50ties. Even then they had extra photo sheets if needed. Check the photos on cover - such a quality you will not see in the book. This was very disappointing for me - on some pictures you even miss the point of an image because of the lack of quality. I was seriously thinking of returning a book (I never did that before). Picture low quality is that overwhelming at first touch that any possible value what book can possibly give can be lost.
-half of book is on LMIS and such an approach is not what I was looking for - this is not a mistake of the book itself - it is a mistake of reviews present here and mostly of description of the book here.
- (for me it was deficit as space was lost on what I did not looked for but can be advantage if someone is looking for this approach)lot of math-physics which I do think is for advanced user and especially everyday user of FIB.

Pluses of the book:
-nicely described channeling effect. One who is looking for such a explanation can take this book as a first reference.
- If someone is looking for thorough description about LMIS - this is the book.

In short way - not as introductory book for students. I find one half of book completely out of my interest even thought I do love FIB and I am a thorough user of its applications.

I am in need to buy Lucille A. Giannuzzi and to see what is in there - its also cheaper.

And one way comment about the price - 150+USD for such a print quality is just a steeling - no offense.


An introduction to the focused ion beams (FIB) technique  Apr 13, 2012 By Ulfilas
The Focused ion beam (FIB) technique has come to be considered particularly useful, both as a method for fabricating transmission electron microscopy (TEM) samples, and as a way of patterning surfaces. FIB is increasingly important in electronics research and development, from the sputter profiling of integrated circuits, to extracting cross-sections of devices for analysis by TEM. The authors lay the theoretical foundation for this technique, including the physics of ion optics and scattering, and the design of metal ion sources. This book also contains a number of figures illustrating the results of FIB fabrication.

0 of 1 found the following review helpful:


Excellent reference of FIB technology  Jun 13, 2004 By Valery Ray
Excellent reference with good balance between theoretical discussion and practical data, very thorough bibliography. The best single source of concentrated information for anyone using or building FIB systems.

Section on Applications of Focused Ion Beams could be significantly expanded in future editions, as the industrial applications of the FIB advance rapidly.